Open Science Research Excellence

Soongyu Kwon

Publications

3

Publications

3
7406
Low Cost Chip Set Selection Algorithm for Multi-way Partitioning of Digital System
Abstract:
This paper considers the problem of finding low cost chip set for a minimum cost partitioning of a large logic circuits. Chip sets are selected from a given library. Each chip in the library has a different price, area, and I/O pin. We propose a low cost chip set selection algorithm. Inputs to the algorithm are a netlist and a chip information in the library. Output is a list of chip sets satisfied with area and maximum partitioning number and it is sorted by cost. The algorithm finds the sorted list of chip sets from minimum cost to maximum cost. We used MCNC benchmark circuits for experiments. The experimental results show that all of chip sets found satisfy the multiple partitioning constraints.
Keywords:
lowest cost chip set, MCNC benchmark, multi-way partitioning.
2
7770
An Embedded System Design for SRAM SEU Test
Abstract:
An embedded system for SEU(single event upset) test needs to be designed to prevent system failure by high-energy particles during measuring SEU. SEU is a phenomenon in which the data is changed temporary in semiconductor device caused by high-energy particles. In this paper, we present an embedded system for SRAM(static random access memory) SEU test. SRAMs are on the DUT(device under test) and it is separated from control board which manages the DUT and measures the occurrence of SEU. It needs to have considerations for preventing system failure while managing the DUT and making an accurate measurement of SEUs. We measure the occurrence of SEUs from five different SRAMs at three different cyclotron beam energies 30, 35, and 40MeV. The number of SEUs of SRAMs ranges from 3.75 to 261.00 in average.
Keywords:
embedded system, single event upset, SRAM
1
14810
Implementation of a Reed-Solomon Code as an ECC in Yet Another Flash File System
Abstract:
Flash memory has become an important storage device in many embedded systems because of its high performance, low power consumption and shock resistance. Multi-level cell (MLC) is developed as an effective solution for reducing the cost and increasing the storage density in recent years. However, most of flash file system cannot handle the error correction sufficiently. To correct more errors for MLC, we implement Reed-Solomon (RS) code to YAFFS, what is widely used for flash-based file system. RS code has longer computing time but the correcting ability is much higher than that of Hamming code.
Keywords:
Reed-Solomon, NAND flash memory, YAFFS, ErrorCorrecting Code, Flash File System