Open Science Research Excellence

ICMCUT 2019 : International Conference on Materials Characterization and Ultrasound Techniques

Lisbon, Portugal
October 30 - 31, 2019

Conference Information

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Paper Submission

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Conference Registration

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Conference Publicity

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Conference Venue

Digital Program consists of the e-proceedings book which is available online-only and includes the conference communications (proceedings abstracts and papers). Registered participants can access the digitally available conference proceedings ( and certificates ) by visiting their profile pages.

Call for Papers

ICMCUT 2019 : International Conference on Materials Characterization and Ultrasound Techniques is the premier interdisciplinary platform for the presentation of new advances and research results in the fields of Materials Characterization and Ultrasound Techniques. The conference will bring together leading academic scientists, researchers and scholars in the domain of interest from around the world. Topics of interest for submission include, but are not limited to:
  • Materials characterization
  • Materials characterization techniques
  • Microscopic-chemical structure and atomic organization
  • Chemical separation and identification
  • Structure of materials
  • Imaging techniques
  • Electron beam instruments
  • Structure determination by diffraction and scattering
  • Neutron and nuclear techniques
  • Physical and magnetic properties
  • Electron emission spectroscopies
  • Microscopy
  • Spectroscopy
  • Macroscopic testing
  • Mechanical testing, including tensile, compressive, torsional, creep, fatigue, toughness and hardness testing
  • Differential thermal analysis
  • Dielectric thermal analysis
  • Thermogravimetric analysis
  • Differential scanning calorimetry
  • Impulse excitation technique
  • Ultrasound techniques
  • Optical microscope
  • Scanning electron microscope
  • Transmission electron microscope
  • Field ion microscope
  • Scanning tunneling microscope
  • Scanning probe microscopy
  • Atomic force microscope
  • X-ray diffraction topography