Open Science Research Excellence

ICRE 2020 : International Conference on Reliability in Electronics

Ottawa, Canada
July 13 - 14, 2020

International Scientific Committee

Rajiv Dutta   Dr. K.n. Modi University, Newai, IN
Bharatiraja Chokkalingam   Srm Institute of Science and Technology, IN
Prakash Mondal   University of Alberta, CA
Hamed Aly   Acadia University, CA
Jovica Riznic   Canadian Nuclear Safety Commission, CA
Ezendu Ariwa   University of Bedfordshire, UK
Kong Fah Tee   University of Greenwich, UK
Bin Wang   Brunel University, UK
Daniil Yurchenko   Heriot - Watt University, UK
Mohammad Al - Amri   University of Surrey, UK
Ka Sing Lim   University of Liverpool, UK
Pragya Kushwaha   University of California Berkeley Usa, US
Kartik Iyer   University of Minnesota, US
Florian Misoc   Kennesaw State University, US
Mohammad Reza Zamani Kouhpanji   University of Minnesota Twin Cities, US
Albert Alexander Stonier   Northeastern University, US
Ehsan Kamrani   Harvard University, US
Florian Misoc   Kennesaw State University, US
Isaac Elishakoff   Florida Atlantic University, US
Soroor Alkhafaji   Auburn University, US
Vardhini Catari Catari   Taylor Business Institute, US
Sclaudina Vargas Montero   Complex Systems Optimization Lab, US
Muhammad Rashid   University of West Florida, US
Broderick Oluyede   Georgia Southern University, US
Naga Srinivas Korivi   Louisiana State University, US
K Ranee Thiagarajah   Illinois State University, US
Ashok Goel   Michigan Technological University, US
Jiahui Yuan   Georgia Institute of Technology, US
Wei Wu   Northwestern University, US
Md. Shoaibur Rahman Shoaib   Baylor College of Medicine, US
Adel El Shahat   Ohio State University, US
Lili He   San Jose State University, US
Chethan Parameswariah   New Mexico Tech, US
Anu Gokhale   Illinois State University, US
Ishtiaq Hassan Wani   Non Afiliated, SE
Salam Al Zaidi   University of Diyala, IQ
Pradip Kumar Talapatra   Gargi Memorial Institute of Technology, IN
Aidin Delgoshaei   Kharazmi University, IR