Open Science Research Excellence

ICMET 2020 : International Conference on Measurement Engineering and Technology

Toronto, Canada
July 16 - 17, 2020

Call for Papers

ICMET 2020 : International Conference on Measurement Engineering and Technology is the premier interdisciplinary platform for the presentation of new advances and research results in the fields of Measurement Engineering and Technology. The conference will bring together leading academic scientists, researchers and scholars in the domain of interest from around the world. Topics of interest for submission include, but are not limited to:
  • Measurement technology
  • Instrumentation and measurements
  • Instrumentation and measurement technology
  • Measurement science and education
  • Measurement systems
  • Measurement data acquisition
  • Measurements of physical quantities
  • Measurement applications
  • Micro and nano metrology
  • In-process and online metrology
  • Management of measurement processes
  • Optical metrology
  • Surface metrology
  • Machine vision and image processing
  • Intelligent instruments for automation
  • Sensors and actuators
  • Calibration and machine tool performance
  • Material characterization
  • Education and training in metrology